2009年5月11-12日IEEE成像系统技术国际会议

● 会议名称（中文）： 2009IEEE成像系统技术国际会议

● 会议名称（英文）： 2009 IEEE Workshop on Imaging Systems and Techniques (IST 2009)

● 所属学科： 电子、通信与自动控制技术　 
 
● 会议类型： 国际会议 

● 开始日期： 2009-5-11

● 结束日期： 2009-5-12

● 所在国家： 中华人民共和国 

● 所在城市： 广东省   深圳市 

● 具体地点： 深圳市南山区西丽深圳大学城清华校区清华大学深圳研究生院

● 主办单位： IEEE Instrumentation and Measurement Society

● 协办单位： Tsinghua University

● 承办单位： IEEE I&M TC-19 Technical Committee on Imaging Systems and Techniques 

● 议题：

Detector design principles and image formation,Imaging system design and instrumentation etc

● 会议主席： Prof. George C. Giakos

● 摘要截稿日期： 2009-1-31

● 全文截稿日期： 2009-4-15

● 会务组联系方式

联系人： Prof. George C. Giakos
E-mail： giakos@uakron.edu
通讯地址： University of Akron, USA

● 会议网站： http://ist.ieee-ims.org/index.php

● 会议背景介绍：

Following the success of IEEE Workshops on Imaging Systems and Techniques, Stresa, Italy in 2004, Niagara Falls, Canada in 2005, Minori, Italy in 2006, Krakow, Poland in 2007, and Chania, Crete, Greece in 2008, the 2009 IEEE Workshop on Imaging Systems and Techniques (IST 2009) will take place in Shenzhen, China, in collaboration with the Graduate School at Shenzhen of Tsinghua University (Tsinghua Shenzhen) and Chinese Instrumentation and Control Society.

IST2009 deals with the design, development, evaluation and applications of imaging systems, instrumentation, and measuring techniques, to enhance detection and image quality. Applications for aerospace, medicine and biology, molecular imaging, metrology, ladar and lidars, radars, homeland security, and industrial imaging with emphasis on industrial tomography, corrosion imaging, and non-destructive evaluation (NDE) will be covered. The following areas will be particularly considered:

•Detectors and image formation
•Imaging system design, instrumentation and measuring techniques
•Compact design of optical system
•Linear and nonlinear techniques for image processing
•Biometrics
•Emerging technologies

In addition, invited keynotes and special sessions will be arranged. It is planned to organise a special issue with a journal after the Workshop.
 
● 征文范围及要求：

The following areas but not limited will
be considered:
•  Detector design principles and image formation
•  Imaging system design and instrumentation 
•  Image measurements, analysis and techniques
• Biometrics
•  Linear and non-linear processing techniques
•  Medical imaging and bio-nano-photonics
•  Environmental monitoring, energy resources
•  Molecular imaging and metabolic imaging
•  Remote sensing, passive and active sensing 
•  Subsurface inspection, corrosion imaging
•  Radiation detection, airport security and cargo
Inspection-standoff detection techniques
•  Electromagnetic Imaging and inverse scattering
•  Polarimetric Imaging and lasers